Interactive effects in the reactive ion etching of SiGe alloys

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Depth profiling of the Ge concentration in SiGe alloys using in situ ellipsometry during reactive-ion etching

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ژورنال

عنوان ژورنال: Applied Physics Letters

سال: 1991

ISSN: 0003-6951,1077-3118

DOI: 10.1063/1.104942